ADCA02

CAMBEL, Vladimír - ELIÁŠ, Peter - GREGUŠOVÁ, Dagmar - FEDOR, Ján - MARTAUS, Jozef - KARAPETROV, Goran - NOVOSAD, V. - KOSTIČ, Ivan. Novel magnetic tips developed for the switching magnetization magnetic force microscopy. In Journal of Nanoscience and Nanotechnology, 2010, vol.10, p. 4477-4481. (1.435 - IF2009). (2010 - Current Contents). ISSN 1533-4880.

ADCA03

DUJAVOVÁ, Agáta - SOJKOVÁ, Michaela - CHROMIK, Štefan - ŠTRBÍK, Vladimír - KOSTIČ, Ivan. Tl-based patterned superconducting structures: fabrication and study. In Superconductor Science and Technology, 2010, vol. 23, art. no. 045007. (2.694 - IF2009). (2010 - Current Contents, SCOPUS). ISSN 0953-2048.

ADCA04

GREGUŠOVÁ, Dagmar - KÚDELA, Róbert - ELIÁŠ, Peter - ŠOLTÝS, Ján - KOSTIČ, Ivan - CAMBEL, Vladimír. GaAs/AlAs/InGaP heterostructure: a versatile material basis for cantilever designs. In Journal of Micromechanics and Microengineering, 2010, vol. 20, art. no. 097001. (1.997 - IF2009). (2010 - Current Contents). ISSN 0960-1317.

ADCA05

SAROV, Y. - FRANK, A. - IVANOV, Tzv. - ZÖLLNER, J.-P. - IVANOVA, K. - VOLLAND, B. - RANGELOW, I.W. - BROGAN, A. - WILSON, R. - ZAWIERUCHA, P. - ZIELONY, M. - GOTSZALK, T. - NIKOLOV, N. - ZIER, M. - SCHMIDT, B - KOSTIČ, Ivan. Parallel proximal probe arrays with vertical interconnections. In Journal of Vacuum Science and Technology B.Microelectronics and Nanometer Structures, 2009, vol. 27, no. 6, p. 3132-3138. (1.445 - IF2008). (2009 - Current Contents). ISSN 1071-1023.

ADCA07

VUTOVA, Katia - KOLEVA, Elena - MLADENOV, Georgy - KOSTIČ, Ivan - TANAKA, T. Computer simulation of resist profiles at electron beam nanolithography. In Microelectronic Engineering : an international journal of semiconductor manufacturing technology, 2010, vol. 87, p. 1108-1111. (1.488 - IF2009). (2010 - Current Contents). ISSN 0167-9317.

ADEB05

LALINSKÝ, Tibor - RÝGER, I. - VANKO, Gabriel - TOMÁŠKA, M. - KOSTIČ, Ivan - HAŠČÍK, Štefan - VALLO, Martin. AlGaN/GaN based SAW-HEMT structures for chemical gas sensors. In Procedia Engineering : Proc. Eurosensors XXIV, 2010, vol. 5, p. 152-155. ISSN 1877-7058.

ADEB06

VANKO, Gabriel - DRŽÍK, Milan - VALLO, Martin - LALINSKÝ, Tibor - KUTIŠ, V. - STANČÍK, S. - RÝGER, I. - KOSTIČ, Ivan. AlGaN/GaN C-HEMT structures for dynamic stress detection. In Procedia Engineering : Proc. Eurosensors XXIV, 2010, vol. 5, p. 1405-1408. ISSN 1877-7058.

AEC17

ĎURINA, P. - ŠTEFEČKA, M. - ROCH, T. - NOSKOVIČ, Ján - TRGALA, M. - PIDÍK, A. - KOSTIČ, Ivan - KONEČNÍKOVÁ, Anna - MATAY, Ladislav - KÚŠ, P. - PLECENÍK, A. Patterning of nanometer structures by using direct-write e-beam lithography for the sensor development. In ASDAM 2010 : proceedings of the 8th International Conference on Advanced Semiconductor Devices and Microsystems. Eds. J. Breza, D. Donoval a E. Vavrinský. - Piscataway : IEEE, 2010, p. 89-92. ISBN 978-1-4244-8572-7.

AEC23

KOSTIČ, Ivan - BENČÚROVÁ, Anna - BARÁK, Vladislav - RITOMSKÝ, Adrian - KONEČNÍKOVÁ, Anna - NEMEC, Pavol - ANDOK, Róbert - MATAY, Ladislav - HRKÚT, Pavol - ČAPLOVIČ, Igor. Investigation of exposure parameters of e-beam resists for photomasks fabrication. In PRONANO : proceedings of the Integrated Project on Massively Parallel Intelligent Cantilever Probe Platforms for Nanoscale Analysis and Synthesis. Eds Th. Sulzbach, I.W. Rangelow. - Münster : MV Wissenschaft, 2010, p. 99-110. ISBN 978-3-86991-177-9.

AEC31

MATAY, Ladislav - ANDOK, Róbert - BARÁK, Vladislav - RITOMSKÝ, Adrian - KONEČNÍKOVÁ, Anna - KOSTIČ, Ivan - PARTEL, S. - HUDEK, Peter. Material optimization of the alignment marks for the EBDW lithography. In ASDAM 2010 : proceedings of the 8th International Conference on Advanced Semiconductor Devices and Microsystems. Eds. J. Breza, D. Donoval a E. Vavrinský. - Piscataway : IEEE, 2010, p. 85-88. ISBN 978-1-4244-8572-7.

AEC38

RÝGER, I. - LALINSKÝ, Tibor - VANKO, Gabriel - TOMÁŠKA, M. - KOSTIČ, Ivan - HAŠČÍK, Štefan - VALLO, Martin. HEMT-SAW structures for chemical gas sensors in harsh environment. In ASDAM 2010 : proceedings of the 8th International Conference on Advanced Semiconductor Devices and Microsystems. Eds. J. Breza, D. Donoval and E. Vavrinský. - Piscataway : IEEE, 2010, p. 131-134. ISBN 978-1-4244-8572-7.

AED23

MATAY, Ladislav - ANDOK, Róbert - RITOMSKÝ, Adrian - BARÁK, Vladislav - KOSTIČ, Ivan - PARTEL, S. - HUDEK, Peter. Alignment marks for the EBDW lithography. In APCOM 2010 : proceedings of the 16th International Conference on Applied Physics of Condensed matter. Eds. J. Vajda and M. Weiss. - Bratislava : Slovenská technická univerzita v Bratislave, 2010, p. 252-255. ISBN 978-80-227-3307-6.

AFG01

SMATKO, Vasilij - LOBOTKA, Peter - KOVÁČOVÁ, Eva - SKÁKALOVÁ, V. - JABLONSKÁ, Viera. Carbon nanotubes/PMMA composite gas sensor. In International Conference NANOHARD 2009 : nanostructured materials, thin films and hard coatings for advanced applications. - 2010, p. 51.

AFHA01

CHITU, Lívia - HALAHOVETS, Yuriy - JERGEL, Matej - MAJKOVÁ, Eva - SIFFALOVIC, P. - LUBY, Štefan - KOSTIČ, Ivan - SATKA, A. - ULMEANU, M. - SZYMANSKI, B. - STOBIESKI, F. Nanosphere lithography for fabrication of novel magnetic nanostructures. In Programme and book of abstracts : 13th Joint Vacuum Conference. - Bratislava : Slovak Vacuum Society, 2010, p. 79. ISBN 978-80-7399-969-8.

GHG01

VALLO, Martin - LALINSKÝ, Tibor - VANKO, Gabriel - DRŽÍK, Milan - HAŠČÍK, Štefan - RÝGER, I. - KOSTIČ, Ivan. AlGaN/GaN C-HEMT for piezoelectric MEMS stress sensor appliocations. In MME 2010 : 21st Micromechanics and Micro systems Europe Workshop. - http://www.utwente.nl/ewi/mme2010/Program/, 2010.